Paper
22 February 2006 High performance 1.3μm quantum dot lasers on GaAs and Silicon
P. Bhattacharya, Z. Mi, J. Yang, S. Fathpour
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Abstract
We have investigated the molecular beam epitaxial growth and characteristics of self-organized In(Ga)As quantum dot lasers grown on GaAs and silicon. Utilizing the techniques of tunnel injection and acceptor-doping of quantum dots, we have achieved high performance 1.3 μm InAs quantum dot lasers on GaAs, which exhibit Jth=180 A/cm2, T0=∞, dg/dn≈1×10-14 cm2, f-3dB=11 GHz, chirp of 0.1 Å and zero α-parameter. Utilizing thin (⩽ 2 μm) GaAs buffer layers and quantum dots as dislocation filters, we have demonstrated room-temperature operational In0.5Ga0.5As quantum dot lasers grown directly on silicon, which are characterized by relatively low threshold current (Jth ~ 900 A/cm2), high output power (> 150 mW), large characteristic temperature (T0 = 244 K) and constant output slope efficiency (⩾ 0.3 W/A) in the temperature range of 5 to 95 °C.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Bhattacharya, Z. Mi, J. Yang, and S. Fathpour "High performance 1.3μm quantum dot lasers on GaAs and Silicon", Proc. SPIE 6133, Novel In-Plane Semiconductor Lasers V, 61330U (22 February 2006); https://doi.org/10.1117/12.641472
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KEYWORDS
Gallium arsenide

Silicon

Quantum dots

Semiconductor lasers

Indium arsenide

Quantum dot lasers

Laser damage threshold

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