Paper
5 January 2006 Experimental and computational study on laser heating of surface micromachined cantilevers
Leslie M. Phinney, Olga Blum Spahn, C. Channy Wong
Author Affiliations +
Abstract
Microsystems are potentially exposed to laser irradiation during processing, diagnostic measurements, and, in some cases, device operation. The behavior of the components in an optical MEMS device that are irradiated by a laser needs to be optimized for reliable operation. Utilizing numerical simulations facilitates design and optimization. This paper reports on experimental and numerical investigations of the thermomechanical response of polycrystalline silicon microcantilevers that are 250 μm wide, 500 μm long, and 2.25 μm thick when heated by an 808 nm laser. At laser powers above 400 mW significant deflection is observed during the laser pulse using a white light interferometer. Permanent deformation is detected at laser powers above 650 mW in the experiments. Numerical calculations using a coupled physics finite element code, Calagio, agree qualitatively with the experimental results. Both the experimental and numerical results reveal that the initial stress state is very significant. Microcantilevers deflect in the direction of their initial deformation upon irradiation with a laser.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leslie M. Phinney, Olga Blum Spahn, and C. Channy Wong "Experimental and computational study on laser heating of surface micromachined cantilevers", Proc. SPIE 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V, 611108 (5 January 2006); https://doi.org/10.1117/12.647487
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microelectromechanical systems

Laser irradiation

Microopto electromechanical systems

Pulsed laser operation

Scanning electron microscopy

Silicon

Absorption

Back to Top