Paper
9 February 2006 New developments in image-based characterization of coated particle nuclear fuel
Jeffery R. Price, Deniz Aykac, John D. Hunn, Andrew K. Kercher, Robert N, Morris
Author Affiliations +
Proceedings Volume 6070, Machine Vision Applications in Industrial Inspection XIV; 60700H (2006) https://doi.org/10.1117/12.647834
Event: Electronic Imaging 2006, 2006, San Jose, California, United States
Abstract
We describe in this paper new developments in the characterization of coated particle nuclear fuel using optical microscopy and digital imaging. As in our previous work, we acquire optical imagery of the fuel pellets in two distinct manners that we refer to as shadow imaging and cross-sectional imaging. In shadow imaging, particles are collected in a single layer on an optically transparent dish and imaged using collimated back-lighting to measure outer surface characteristics only. In cross-sectional imaging, particles are mounted in acrylic epoxy and polished to near-center to reveal the inner coating layers for measurement. For shadow imaging, we describe a curvaturebased metric that is computed from the particle boundary points in the FFT domain using a low-frequency parametric representation. We also describe how missing boundary points are approximated using band-limited interpolation so that the FFT can be applied. For cross-section imaging, we describe a new Bayesian-motivated segmentation scheme as well as a new technique to correct layer measurements for the fact that we cannot observe the true mid-plane of the approximately spherical particles.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeffery R. Price, Deniz Aykac, John D. Hunn, Andrew K. Kercher, and Robert N, Morris "New developments in image-based characterization of coated particle nuclear fuel", Proc. SPIE 6070, Machine Vision Applications in Industrial Inspection XIV, 60700H (9 February 2006); https://doi.org/10.1117/12.647834
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Particles

Image segmentation

Image analysis

Polishing

Image processing

Surface finishing

Coating

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