Paper
6 February 2006 Quantum efficiency characterization of back-illuminated CCDs: Part II. Reflectivity measurements
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Proceedings Volume 6068, Sensors, Cameras, and Systems for Scientific/Industrial Applications VII; 60680G (2006) https://doi.org/10.1117/12.667314
Event: Electronic Imaging 2006, 2006, San Jose, California, United States
Abstract
The usual QE measurement heavily relies on a calibrated photodiode (PD) and the knowledge of the CCD's gain. Either can introduce significant systematic errors. But 1-R ≥QE, where R is the reflectivity. Over a significant wavelength range, 1-R = QE. An unconventional reflectometer has been developed to make this measurement. R is measured in two steps, using light from the lateral monochromator port via an optical fiber. The beam intensity is measured directly with a PD, then both the PD and CCD are moved so that the optical path length is unchanged and the light reflects once from the CCD; the PD current ratio is R. Unlike the traditional VW scheme this approach makes only one reflection from the CCD surface. Since the reflectivity of the LBNL CCDs might be as low as 2% this increases the signal to noise ratio dramatically. The goal is a 1% accuracy. We obtain good agreement between 1 - R and the direct QE results.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maximilian H. Fabricius, Chris J. Bebek, Donald E. Groom, Armin Karcher, and Natalie A. Roe "Quantum efficiency characterization of back-illuminated CCDs: Part II. Reflectivity measurements", Proc. SPIE 6068, Sensors, Cameras, and Systems for Scientific/Industrial Applications VII, 60680G (6 February 2006); https://doi.org/10.1117/12.667314
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Cited by 10 scholarly publications.
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KEYWORDS
Charge-coupled devices

Quantum efficiency

Photodiodes

Reflectivity

Projection systems

Calibration

Monochromators

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