Paper
10 November 2005 High resolution angular measurement using surface-plasmon-resonance heterodyne interferometry at optimal incident wavelengths
Hai-Pang Chiang, Jing-Lun Lin, Railing Chang, Zhi-Wei Chen, Pui Tak Leung
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Abstract
We have recently demonstrated that ultra high resolution of angular measurement down to 10-6 degree can be achieved via surface-plasmon-resonance heterodyne interferometry, in which the phase difference between p- and s- polarized reflected waves is monitored as a function of the incident angle. Here we give a brief summary of this technique and the rationale based on which such a measurement is possible. As a further study, we have also investigated, via simulation, how the change in environmental temperature will affect the resolution limit of this very versatile technique.
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Hai-Pang Chiang, Jing-Lun Lin, Railing Chang, Zhi-Wei Chen, and Pui Tak Leung "High resolution angular measurement using surface-plasmon-resonance heterodyne interferometry at optimal incident wavelengths", Proc. SPIE 6002, Nanofabrication: Technologies, Devices, and Applications II, 600218 (10 November 2005); https://doi.org/10.1117/12.630594
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KEYWORDS
Spatial resolution

Interferometry

Heterodyning

Temperature metrology

Reflection

Reflectivity

Silver

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