Paper
16 July 1986 Electronic Speckle Pattern Interferometer (ESPI) Fringe Manipulation
A. C. Rowland
Author Affiliations +
Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952381
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Amplitude and specific phase modulation techniques are used to reduce the complexity of ESPI fringes describing the deformation of a submerged elastomeric subject. This leads to a characterisation of the volume viscoelasticity of the elastomer.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. C. Rowland "Electronic Speckle Pattern Interferometer (ESPI) Fringe Manipulation", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); https://doi.org/10.1117/12.952381
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KEYWORDS
Mirrors

Metals

Refractive index

Fringe analysis

Modulation

Phase shift keying

Optical testing

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