Paper
30 September 2005 Z-scan characterization of the nonlinear refractive index of single crystal ZnSe in the 1.20-1.95 μm wavelength range
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Abstract
The nonlinear refractive index, n2, of single crystal ZnSe was characterized in the 1200-1950 nm wavelength region using the z-scan technique with picosecond pulses provided by a widely tunable traveling-wave optical parametric amplifier. We have found that the n2 values range from ~15.8×10-6 to ~9.3×10-6 cm2/GW. The measured spectrum and scaling of the nonlinear refractive index complements previously reported values at shorter wavelengths, and is in good agreement with a theoretical model based on the nonlinear Kramers-Kroenig transformation.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arkady Major, J. Stewart Aitchison, Peter W. E. Smith, Evgeni Sorokin, and Irina T. Sorokina "Z-scan characterization of the nonlinear refractive index of single crystal ZnSe in the 1.20-1.95 μm wavelength range", Proc. SPIE 5971, Photonic Applications in Nonlinear Optics, Nanophotonics, and Microwave Photonics, 59710H (30 September 2005); https://doi.org/10.1117/12.628686
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Cited by 7 scholarly publications.
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KEYWORDS
Refractive index

Absorption

Crystals

Refraction

Nonlinear optics

Nonlinear crystals

Optical amplifiers

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