Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry

Petr Hlubina; Igor Gurov; Vladimir Chugunov

doi:10.1117/12.638912

6 December 2006 Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry

Petr Hlubina, Igor Gurov, Vladimir Chugunov

Author Affiliations +

Proceedings Volume 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 59450H (2006) https://doi.org/10.1117/12.638912
Event: 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2005, Nitra, Slovakia

Abstract

A phase-locked loop method is applied in processing the spectral interferograms resolved in a narrow spectral range in a dispersive Michelson interferometer including optical elements. The unwrapped spectral fringe phases with 2π ambiguity are determined and a simple procedure in removing the ambiguity is applied to obtain the effective thicknesses of the optical elements knowing their dispersion. The effective thicknesses determined in two cases are compared with those obtained by measuring the equalization wavelengths. A Fourier transform method is applied in processing the spectral interferogram resolved over a wide spectral range in a slightly dispersive Michelson interferometer including a cube beamsplitter. The ambiguous spectral fringe phase is determined and a procedure in removing its ambiguity is applied to obtain the effective thickness of the beamsplitter.

Citation Download Citation

Petr Hlubina, Igor Gurov, and Vladimir Chugunov "Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry", Proc. SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 59450H (6 December 2006); https://doi.org/10.1117/12.638912

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