Dynamic interferometry

Neal Brock; John Hayes; Brad Kimbrough; James Millerd; Michael North-Morris; Matt Novak; James C. Wyant

doi:10.1117/12.621245

29 August 2005 Dynamic interferometry

Neal Brock, John Hayes, Brad Kimbrough, James Millerd, Michael North-Morris, Matt Novak, James C. Wyant

Proceedings Volume 5875, Novel Optical Systems Design and Optimization VIII; 58750F (2005) https://doi.org/10.1117/12.621245
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

The largest limitation of phase-shifting interferometry for optical testing is the sensitivity to the environment, both vibration and air turbulence. In many situations the measurement accuracy is limited by the environment and sometimes the environment is sufficiently bad that the measurement cannot be performed. Recently there have been several advances in dynamic interferometry techniques for reducing effects of vibration. This talk will describe and compare two dynamic interferometry techniques; simultaneous phase-shifting interferometry and a special form of spatial carrier interferometry utilizing a micropolarizer phase-shifting array.

Citation Download Citation

Neal Brock, John Hayes, Brad Kimbrough, James Millerd, Michael North-Morris, Matt Novak, and James C. Wyant "Dynamic interferometry", Proc. SPIE 5875, Novel Optical Systems Design and Optimization VIII, 58750F (29 August 2005); https://doi.org/10.1117/12.621245

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