Measurement of 1/f Noise of HgCdTe, PtSi, and InSb

A. L. Vinson; E. L. Dereniak

doi:10.1117/12.950680

23 February 1985 Measurement of 1/f Noise of HgCdTe, PtSi, and InSb

A. L. Vinson, E. L. Dereniak

Proceedings Volume 0572, Infrared Technology XI; (1985) https://doi.org/10.1117/12.950680
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

This paper describes a preliminary investigation of l/f noise in three infrared detector materials used in the MWIR (3-5um). Noise measurements of HgCdTe, PtSi, and InSb detectors were conducted and the results are presented. The various noise sources are discussed.

Citation Download Citation

A. L. Vinson and E. L. Dereniak "Measurement of 1/f Noise of HgCdTe, PtSi, and InSb", Proc. SPIE 0572, Infrared Technology XI, (23 February 1985); https://doi.org/10.1117/12.950680

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