Paper
27 April 2005 High-resolution absolute temperature mapping of laser crystals in diode-end-pumped configuration
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Abstract
We report on direct, absolute and spatially resolved temperature measurements in various diode-end-pumped laser crystals, using an infrared camera. Our measurement method requires careful calibrations of the camera, to take into account the emissivity of the crystals. We tested the repeatability of the calibration process, and the linearity of calibrations curves was verified to up to 100°C. We obtained good agreement between experimental results and finite elements analysis simulations done with LASCAD. We also studied and compared different types of thermal contacts and to measure the corresponding heat transfer coefficients using an Yb:YAG crystal. Finally we tried to highlight one of the major controversy concerning the comparison of the thermal behaviours of Nd:YVO4 and Nd:GdVO4 crystals.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Julien Didierjean, Sebastien Forget, Sebastien Chenais, Frederic Druon, Francois Balembois, Patrick Georges, Konrad Altmann, and Christoph Pflaum "High-resolution absolute temperature mapping of laser crystals in diode-end-pumped configuration", Proc. SPIE 5707, Solid State Lasers XIV: Technology and Devices, (27 April 2005); https://doi.org/10.1117/12.593895
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Cited by 5 scholarly publications.
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KEYWORDS
Crystals

Laser crystals

Temperature metrology

Calibration

Cameras

Infrared cameras

Nd:YAG lasers

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