Extension of the ISO 12233 SFR measurement technique to provide MTF bounds for critical imaging arrays

Robin B. Jenkin; Ralph E. Jacobson; Mark A. Richardson; Ian C. Luckraft

doi:10.1117/12.593081

17 January 2005 Extension of the ISO 12233 SFR measurement technique to provide MTF bounds for critical imaging arrays

Robin B. Jenkin, Ralph E. Jacobson, Mark A. Richardson, Ian C. Luckraft

Proceedings Volume 5668, Image Quality and System Performance II; (2005) https://doi.org/10.1117/12.593081
Event: Electronic Imaging 2005, 2005, San Jose, California, United States

Abstract

The ISO 12233 SFR measurement technique provides a quick and reliable method to evaluate the SFR and, with slight modification, the MTF of digital imaging systems. This work demonstrates that the MTF provided by the technique approaches the theoretical result for a single imaging element once all other factors, such as image forming optics, have been accounted for. Digital imaging is being increasingly accepted as a solution for critical systems as issues regarding security and provenience are being resolved. The evidential need for recording fingerprints is just one example. Jenkin et al. previously showed that a lower bound of array MTF could be derived taking account of the sampling pitch, aperture and phase differences between the signal and imaging elements. This is a pessimistic estimate of array performance and, as such, holds advantages for design of critical systems. This work shows simple extension of the ISO 12233 SFR measurement technique to provide an estimate of the lower bound and compares it to known exposures of a simple Monte-Carlo model and a commercial digital camera.

Citation Download Citation

Robin B. Jenkin, Ralph E. Jacobson, Mark A. Richardson, and Ian C. Luckraft "Extension of the ISO 12233 SFR measurement technique to provide MTF bounds for critical imaging arrays", Proc. SPIE 5668, Image Quality and System Performance II, (17 January 2005); https://doi.org/10.1117/12.593081

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available