Quantization of accumulated diffused errors in error diffusion

Ti-chiun Chang; Jan P. Allebach

doi:10.1117/12.584688

17 January 2005 Quantization of accumulated diffused errors in error diffusion

Ti-chiun Chang, Jan P. Allebach

Proceedings Volume 5667, Color Imaging X: Processing, Hardcopy, and Applications; (2005) https://doi.org/10.1117/12.584688
Event: Electronic Imaging 2005, 2005, San Jose, California, United States

Abstract

Quantization of the accumulated diffused error (ADE) is an effective means to reduce on-chip storage in a hardware implementation of error diffusion. A simple uniform quantizer can yield a factor of 2 savings with no apparent loss in image quality. Nonuniform quantizers with memory that depend on the quantizer index or various features13 can yield even greater savings -- up to a factor of 4, with essentially no loss in image quality. However, these quantizers depend on the trainability of the tone-dependent error diffusion (TDED) framework to achieve this level of quality. In addition, the design of the quantizers must be coupled to that of the TDED parameters in either a sequential or iterative fashion.

Citation Download Citation

Ti-chiun Chang and Jan P. Allebach "Quantization of accumulated diffused errors in error diffusion", Proc. SPIE 5667, Color Imaging X: Processing, Hardcopy, and Applications, (17 January 2005); https://doi.org/10.1117/12.584688

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