Modeling and verification of the electrical properties of organic dielectric monolayers in capacitive configurations

Michael B. Cortie; Hadi Zareie; Jingquan Liu; Karl-Heinz Mueller; Michael Ford

doi:10.1117/12.582211

28 February 2005 Modeling and verification of the electrical properties of organic dielectric monolayers in capacitive configurations

Michael B. Cortie, Hadi Zareie, Jingquan Liu, Karl-Heinz Mueller, Michael Ford

Author Affiliations +

Proceedings Volume 5649, Smart Structures, Devices, and Systems II; (2005) https://doi.org/10.1117/12.582211
Event: Smart Materials, Nano-, and Micro-Smart Systems, 2004, Sydney, Australia

Abstract

The possible role of self-assembled monolayers (SAMs) as the dielectric component of nanoscale capacitors is considered. SAMs of two rather different molecules, α,α’-p-xylyldithiol ('XYL’) and dodecanedithiol ('C12’) were produced on a gold {111} substrate, and characterized with respect to their conductivity. The data were fitted with a double tunnel barrier model, in which the two SAMs are primarily differentiated by barrier height and thickness with that of XYL having a thickness of 1.0 nm and a barrier height of 0.78 eV compared to 1.69 nm and 1.39 eV for C12. The remaining parameters of the model were determined by Monte Carlo optimization. Assuming perfect connection of top and bottom electrodes, the leakage current through the XYL at 1 volt is calculated to be 1.4x10⁵ A/cm², compared to 2.7x10⁴ A/cm² through C12. These values are not as low as can be obtained with SiO₂ of the same thickness. However, SAMs are readily and precisely produced by simple, low temperature processes, a factor which may allow them a niche in the future.

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Michael B. Cortie, Hadi Zareie, Jingquan Liu, Karl-Heinz Mueller, and Michael Ford "Modeling and verification of the electrical properties of organic dielectric monolayers in capacitive configurations", Proc. SPIE 5649, Smart Structures, Devices, and Systems II, (28 February 2005); https://doi.org/10.1117/12.582211

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