Short path thermal desorption GC/MS for screening of molecular contamination in laser systems

John S. Canham

doi:10.1117/12.585086

21 February 2005 Short path thermal desorption GC/MS for screening of molecular contamination in laser systems

John S. Canham

Proceedings Volume 5647, Laser-Induced Damage in Optical Materials: 2004; (2005) https://doi.org/10.1117/12.585086
Event: Boulder Damage Symposium XXXVI, 2004, Boulder, Colorado, United States

Abstract

In high intensity laser systems, molecular contamination represents a risk to the optics. In most situations, molecular contamination is somewhat of a wild card. It is known that it is not required that the contaminant be condensible to initiate damage within a laser system. It is also known that in many cases materials that pass ASTM E-595, are known to precipitate laser optic damage. What has not been known is why. Methods have been developed for the identification, and potential quantitation of trace material emissions that initiate laser optic damage.

Citation Download Citation

John S. Canham "Short path thermal desorption GC/MS for screening of molecular contamination in laser systems", Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); https://doi.org/10.1117/12.585086

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