Radiation tolerance of extended environment multimode optical transceivers

Brian L. Uhlhorn; Roger S. Kim

doi:10.1117/12.558474

18 October 2004 Radiation tolerance of extended environment multimode optical transceivers

Brian L. Uhlhorn, Roger S. Kim

Proceedings Volume 5554, Photonics for Space Environments IX; (2004) https://doi.org/10.1117/12.558474
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

This paper reports the radiation tolerance of small form factor multimode optical transceivers designed for extended temperature and vibration environments. The transceivers are based on specifically designed VCSELs and PIN photodiodes and packaged such that the transceiver functions over an extended temperature range (beyond -40 to +85°C) without affecting performance or dynamic range. These transceivers are capable of multi-Gigabit per second transmission with bit error ratio of less than 1e-12 in non-irradiated conditions. To characterize these transceivers, we have measured their response to dose rate, total dose, and neutron fluence environments. For the dose rate test, we report the upset, latch-up, and burnout thresholds of the transceiver. In the total dose test, we measure the total dose level that does not significantly affect the transceiver and characterize the degradation for increasing total dose levels. For the neutron fluence test, we measure the fluence level that does not significantly affect the transceiver and characterize the degradation for increasing fluence levels. With this radiation data on the performance limits and penalties of the transceiver, high speed fiber optic links may now be considered for platforms previously off limits due to their irradiated environments.

Citation Download Citation

Brian L. Uhlhorn and Roger S. Kim "Radiation tolerance of extended environment multimode optical transceivers", Proc. SPIE 5554, Photonics for Space Environments IX, (18 October 2004); https://doi.org/10.1117/12.558474

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available