Hard x-ray Fresnel prisms: properties and applications

James M. Ablett; Kenneth Evans-Lutterodt; Aaron Stein

doi:10.1117/12.560323

4 November 2004 Hard x-ray Fresnel prisms: properties and applications

James M. Ablett, Kenneth Evans-Lutterodt, Aaron Stein

Proceedings Volume 5539, Design and Microfabrication of Novel X-Ray Optics II; (2004) https://doi.org/10.1117/12.560323
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

To image weakly absorbing materials (e.g. biological specimens, thin films, etc.) with hard x-ray photons, phase-contrast methods have to be applied to enhance the image contrast. Micro-fabricated Fresnel prisms in silicon have been manufactured to enable wavefront division of the incoming x-ray beam for phase-contrast applications. To maximize the efficiency and aperture of these optics, multiples of 2π phase-shifting regions in a conventional prism structure have been deleted, leading to structures that are arrays of micro-prisms. We show preliminary results of x-ray beam deflection using a variety of micro-prism arrays at the NSLS X13B undulator beamline at 11.3 keV.

Citation Download Citation

James M. Ablett, Kenneth Evans-Lutterodt, and Aaron Stein "Hard x-ray Fresnel prisms: properties and applications", Proc. SPIE 5539, Design and Microfabrication of Novel X-Ray Optics II, (4 November 2004); https://doi.org/10.1117/12.560323

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