Paper
21 October 2004 Genetic algorithm optimization of x-ray multilayer coatings
Pietro D. Binda, Fabio E. Zocchi
Author Affiliations +
Abstract
A simple genetic algorithm for global optimisation of the reflectivity of multilayer coatings in the extreme ultra-violet and X-ray wavelength ranges has been implemented as a software tool. The genetic algorithm identifies the best-performing multilayer among a population of solutions that evolves while random mutations are applied to the thickness of the layers. The tool is designed for maximising the reflectivity either over a wavelength range at fixed incident angle or over a range of incident directions at fixed energy. The algorithm has been preliminarily tested on two specific applications: a Pt/C multilayer for hard X-rays applications in astrophysics and cosmology and a Mo/Si coating prominent to next generation lithography at 13.5 nm. The results of the analyses are compared to the performances achievable with periodic multilayers and traditional supermirrors.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pietro D. Binda and Fabio E. Zocchi "Genetic algorithm optimization of x-ray multilayer coatings", Proc. SPIE 5536, Advances in Computational Methods for X-Ray and Neutron Optics, (21 October 2004); https://doi.org/10.1117/12.568104
Lens.org Logo
CITATIONS
Cited by 19 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reflectivity

Multilayers

Genetic algorithms

X-rays

Interfaces

Mirrors

Genetics

Back to Top