Optical diffraction strain sensor

Anand Krishna Asundi

doi:10.1117/12.555654

2 August 2004 Optical diffraction strain sensor

Anand Krishna Asundi

Proceedings Volume 5532, Interferometry XII: Applications; (2004) https://doi.org/10.1117/12.555654
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Moire interferometry is a high sensitivity tool for deformation measurement. Micro-moire interferometry (MMI) extends this into the micron-level spatial resolution. However, the information available in both cases is in the form of a deformation map, which needs to be differentiated to determine strains. The Optical Diffraction Strain Sensor (ODSS) directly provides strain information. This is generally a point-wise approach and scanning of the specimen is necessary to obtain full-field strains. At the same time, while strains are important, the deformation map is also relevant. Hence an integrated strain sensor is proposed. To overcome the scanning, a novel sensor scheme is proposed.

Citation Download Citation

Anand Krishna Asundi "Optical diffraction strain sensor", Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); https://doi.org/10.1117/12.555654

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