Paper
15 July 2004 Effect of mesoscopic objects located inside a sample on the distribution of light in surface near-field optical microscopy
Andrey B. Evlyukhin, E. V. Evlyukhina
Author Affiliations +
Proceedings Volume 5506, Nonresonant Laser-Matter Interaction (NLMI-11); (2004) https://doi.org/10.1117/12.580000
Event: Nonresonant Laser-Matter Interaction (NLMI-11), 2003, St. Petersburg, Russian Federation
Abstract
A theoretical model of the interaction between finite mesoscopic objects within the layer structure situated on a substrate and the light in the near-field zone is presented. Consideration is based on a set of self-consistent integral equations for the electric field obtained from the Maxwell equations using a Green-function technique. In the work we give special attention to construct in the quasi-electrostatic approximation the dyadic Green's function of the reference system, which includes the substrate and the solid layer embedded in an infinite homogeneous medium. Our approach also allows us to construct the Green's function for two mediums with plane interface. We use unretarded approximation due to the fact that the distances between all points, which are included in the consideration, are assumed to be much smaller than the wavelength of the light in SNOM. On the base of this approach we obtain the analytical expression of the dyadic Green's function in direct space and numerically calculate the distribution of electric field intensity in the system. We consider two SNOM configurations. We show that the layer structure and substrate may play significant role in image formation. In the work we also discuss the scattering problem of longitudinal surface polaritons in SNOM of the collection configuration.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrey B. Evlyukhin and E. V. Evlyukhina "Effect of mesoscopic objects located inside a sample on the distribution of light in surface near-field optical microscopy", Proc. SPIE 5506, Nonresonant Laser-Matter Interaction (NLMI-11), (15 July 2004); https://doi.org/10.1117/12.580000
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KEYWORDS
Dielectrics

Particles

Near field scanning optical microscopy

Near field

Signal detection

Sensors

Interfaces

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