Model validation of SIM external metrology at the sub-nanometer level

Bijan Nemati; Gary M. Kuan

doi:10.1117/12.549700

20 October 2004 Model validation of SIM external metrology at the sub-nanometer level

Bijan Nemati, Gary M. Kuan

Proceedings Volume 5491, New Frontiers in Stellar Interferometry; (2004) https://doi.org/10.1117/12.549700
Event: SPIE Astronomical Telescopes + Instrumentation, 2004, Glasgow, United Kingdom

Abstract

In order to achieve micro-arcsecond astrometry, SIM must make measurements of various optical pathlengths at the picometer level. In this regime of precision, nearly every simplifying assumption in optics must be reexamined as a potential source of systematic error. SIM makes extensive use of physics-based models to predict the form and level of systematic errors affecting instrument performance. Since many of the modeling areas represent new frontiers in optical modeling, the validation of these physical models is a significant challenge that SIM must meet. In the case of the external metrology truss, the model must account for the imperfections in the corner cubes as well as the distance measuring interferometers ("beam launchers"). This model is being validated using the Kite testbed, a 2-D metrology truss with picometer-level accuracy in displacement measurements. We present the model, and the results of the model validation tests on the Kite testbed.

Citation Download Citation

Bijan Nemati and Gary M. Kuan "Model validation of SIM external metrology at the sub-nanometer level", Proc. SPIE 5491, New Frontiers in Stellar Interferometry, (20 October 2004); https://doi.org/10.1117/12.549700

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