High-resolution x-ray spectroscopy of optically-thin sources

Frits B. S. Paerels

doi:10.1117/12.561499

11 October 2004 High-resolution x-ray spectroscopy of optically-thin sources

Frits B. S. Paerels

Proceedings Volume 5488, UV and Gamma-Ray Space Telescope Systems; (2004) https://doi.org/10.1117/12.561499
Event: SPIE Astronomical Telescopes + Instrumentation, 2004, Glasgow, United Kingdom

Abstract

High resolution X-ray spectroscopy of optically thin sources is discussed. Based on a brief description of the general properties of highly ionized, optically thin sources and their spectra, and a set of specific examples drawn from the recent literature, I outline arguments for the importance of routine spectroscopy of faint sources as a science driver for future missions.

Citation Download Citation

Frits B. S. Paerels "High-resolution x-ray spectroscopy of optically-thin sources", Proc. SPIE 5488, UV and Gamma-Ray Space Telescope Systems, (11 October 2004); https://doi.org/10.1117/12.561499

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