Laser Measurement Techniques - Laser Spectroscop In Semiconductors

E. D. Jones; G. L. Wickstrom

doi:10.1117/12.976138

20 November 1985 Laser Measurement Techniques - Laser Spectroscopy In Semiconductors

E. D. Jones, G. L. Wickstrom

Proceedings Volume 0540, Southwest Conf on Optics '85; (1985) https://doi.org/10.1117/12.976138
Event: 1985 Albuquerque Conferences on Optics, 1985, Albuquerque, United States

Abstract

A CAMAC-based digital data acquisition system to study luminescence spectra and dynamics in semiconductors using pulsed and cw laser sources is described. Various experimental techniques for measuring time-dependent luminescence and laser excitation spectra are discussed. In order to demonstrate the system performance and sensitivity of this data acquisition system, experimental low-temperature laser-induced luminescence data for the oxygen-bound exciton in the II-VI semiconductor compound ZnTe is presented.

Citation Download Citation

E. D. Jones and G. L. Wickstrom "Laser Measurement Techniques - Laser Spectroscopy In Semiconductors", Proc. SPIE 0540, Southwest Conf on Optics '85, (20 November 1985); https://doi.org/10.1117/12.976138

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