Paper
18 June 2004 Low-threshold, high-T0 and high-efficiency 1300nm and 1500nm lasers with AlInGaAs active region grown by MOCVD
Ashish Tandon, David P. Bour, Ying Lan Chang, Chao Kun Lin, Scott W. Corzine, Michael R. Tan
Author Affiliations +
Abstract
We report results for broad area edge emitting lasers having AlInGaAs active regions that exhibit low thresholds, high T0 and T1 and high efficiencies. The lasers were grown on InP substrates using MOCVD. This paper analyzes the effects of doping, epilayer design, wavelength dependence and number of QWs on device performance. Our results show that the concentration and offset of zinc doping in the p-cladding layer plays a major role in carrier confinement and hence high temperature performance. The difference in surface mobility of Al adatoms (as compared to In or Ga) poses some challenges in the growth of AlInGaAs.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashish Tandon, David P. Bour, Ying Lan Chang, Chao Kun Lin, Scott W. Corzine, and Michael R. Tan "Low-threshold, high-T0 and high-efficiency 1300nm and 1500nm lasers with AlInGaAs active region grown by MOCVD", Proc. SPIE 5349, Physics and Simulation of Optoelectronic Devices XII, (18 June 2004); https://doi.org/10.1117/12.540319
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Zinc

Doping

Quantum wells

Laser damage threshold

Quantum efficiency

Aluminum

Gallium

Back to Top