A fast phase-identification method for real-time holographic interferometry

Junchang Li; Bingheng Xiong

doi:10.1117/12.532543

29 June 2004 A fast phase-identification method for real-time holographic interferometry

Junchang Li, Bingheng Xiong

Proceedings Volume 5290, Practical Holography XVIII: Materials and Applications; (2004) https://doi.org/10.1117/12.532543
Event: Electronic Imaging 2004, 2004, San Jose, California, United States

Abstract

Repositing a single exposure hologram to its original place precisely and real-time measuring the phase distribution of the deformed object wave are the foundation of real-time holographic interferometry. In general, phase distribution of the under testing object wave must be determined by measuring the corresponding intensity distribution of several phase shift interferograms. An digital method is introduced in this paper, it greatly simplify the process of determination for the phase distribution of the under testing object wave by using only one interferogram and reduce the precise requirement of the real-time hologram reposition. Some experimental examples are also given in the paper.

Citation Download Citation

Junchang Li and Bingheng Xiong "A fast phase-identification method for real-time holographic interferometry", Proc. SPIE 5290, Practical Holography XVIII: Materials and Applications, (29 June 2004); https://doi.org/10.1117/12.532543

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KEYWORDS

Holograms

Holographic interferometry

Charge-coupled devices

Diffraction

Phase interferometry

Holography

Refractive index

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