Z-scan studies of the nonlinear refractive index of fused silica in the nanosecond regime

Thomas Olivier; Franck Billard; Hassan Akhouayri

doi:10.1117/12.512916

26 February 2004 Z-scan studies of the nonlinear refractive index of fused silica in the nanosecond regime

Thomas Olivier, Franck Billard, Hassan Akhouayri

Proceedings Volume 5252, Optical Fabrication, Testing, and Metrology; (2004) https://doi.org/10.1117/12.512916
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

We present here a Z-scan based experimental setup and an adapted numerical simulation to perform absolute measurements of small nonlinear refractive indexes in the nanosecond regime, where bound electronic, as well as electrostriction and thermal effects, can occur. In order to have a reliable and stable experimental setup and a better sensitivity, a trimmed Airy beam has been used. An accurate study of the spatio-temporal parameters of the beam allows us to take into account the real nature of the beam in the nonlinear refractive index estimation. In these conditions, measurements have been performed in different types of fused silica at 1064nm and 532nm. A nonlinear refractive index of 5.2x10^-20m²/W has been found at 1064nm and 3.5x10^-20 m²/W at 532nm.

Citation Download Citation

Thomas Olivier, Franck Billard, and Hassan Akhouayri "Z-scan studies of the nonlinear refractive index of fused silica in the nanosecond regime", Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); https://doi.org/10.1117/12.512916

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