Normal incidence reflective-mode etalons with novel spectral properties

Robert D Te Kolste

doi:10.1117/12.510827

10 November 2003 Normal incidence reflective-mode etalons with novel spectral properties

Robert D Te Kolste

Proceedings Volume 5177, Gradient Index, Miniature, and Diffractive Optical Systems III; (2003) https://doi.org/10.1117/12.510827
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Etalons having one surface which is highly reflective have been used for a variety of applications. By varying the coating type and carefully controlling the thicknesses of the coatings on the lower reflectance side, one can obtain interesting and useful properties. One example is a low finesse but highly efficient element having a reflectance which is very sinusoidal with respect to wavelength. By adding additional layers, functions which are asymmetric about the reflectance peak with respect to wavelength can be obtained, including behavior which approximates a sawtooth reflectance as a function of wavelength. Such devices are easily fabricated at the wafer scale, and can be used in wavelength monitoring and control applications such as wavelength lockers for tunable lasers.

Citation Download Citation

Robert D Te Kolste "Normal incidence reflective-mode etalons with novel spectral properties", Proc. SPIE 5177, Gradient Index, Miniature, and Diffractive Optical Systems III, (10 November 2003); https://doi.org/10.1117/12.510827

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