Simple polarization phase shifting for scatterplate interferometry

Krzysztof Patorski; Leszek A. Salbut

doi:10.1117/12.500009

30 May 2003 Simple polarization phase shifting for scatterplate interferometry

Proceedings Volume 5144, Optical Measurement Systems for Industrial Inspection III; (2003) https://doi.org/10.1117/12.500009
Event: Optical Metrology, 2003, Munich, Germany

Abstract

Simple polarized light implementation of the phase shifting method for analyzing fringe patterns formed in Burch's common-path scatterplate interferometer has been proposed. The systems employs circularly polarized beam at the input end, a quarter wave plate to change the rotation direction of circular polarization of the reference beam, and a rotating analyzer placed in two counter-rotating circular polarization beams at the output of the interferometer. The simplicity of our approach is proved theoretically and experimentally. Problems related to non-ideal light modulation at the interferometer output and the ways to overcome them are discussed.

Citation Download Citation

Krzysztof Patorski and Leszek A. Salbut "Simple polarization phase shifting for scatterplate interferometry", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); https://doi.org/10.1117/12.500009

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available