The production of 225 x 325 mm sapphire windows for IR (1 to 5 µm) applications

John W. Locher; Herbert E. Bates; Steven A. Zanella; Evan C. Lundstedt; Charles T. Warner

doi:10.1117/12.485701

26 September 2003 The production of 225 x 325 mm sapphire windows for IR (1 to 5 μm) applications

John W. Locher, Herbert E. Bates, Steven A. Zanella, Evan C. Lundstedt, Charles T. Warner

Proceedings Volume 5078, Window and Dome Technologies VIII; (2003) https://doi.org/10.1117/12.485701
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

Edge Defined film Fed Growth (EFG) Saphikon^TM sapphire crystals have been grown and successfully processed into windows measuring 225 x 325 mm with a thickness of 5.6 mm. More than 40 windows have been completed and assembled into customer hardware and delivered. The polished and coated windows have exhibited average transmission >93% from 1 to 5 mm and wavefront measurements of <0.1 waves rms (@ 0.633 μm) over a 125 mm aperture. Optical measurement data are presented and aspects of the crystal growth and polishing processes are discussed.

Citation Download Citation

John W. Locher, Herbert E. Bates, Steven A. Zanella, Evan C. Lundstedt, and Charles T. Warner "The production of 225 x 325 mm sapphire windows for IR (1 to 5 μm) applications", Proc. SPIE 5078, Window and Dome Technologies VIII, (26 September 2003); https://doi.org/10.1117/12.485701

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