Paper
16 June 2003 Novel electron optics for large subfield electron-beam projection lithography (EPL)
Saori Fukui, Hiroyasu Shimizu, Weiming Ren, Shohei Suzuki, Kazuya Okamoto
Author Affiliations +
Abstract
In Electron-beam Projection Lithography (EPL), achieving the requirements for the ITRS 45 nm roadmap node will require decreasing simultaneously both the beam blur from the Coulomb interaction effects and the geometrical aberrations from their present values. Because next generation lithography tools are required to have both high resolution and throughput, the Coulomb effect becoems more of an issue. In this paper, we propose a novel concept to effectively decrease the Coulomb effect. Based on this new concept we develop an EPL electron optical system in which not only the Coulomb effect but also the geometrical aberrations are greatly reduced. We report on the properties of this new EPL optical system.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Saori Fukui, Hiroyasu Shimizu, Weiming Ren, Shohei Suzuki, and Kazuya Okamoto "Novel electron optics for large subfield electron-beam projection lithography (EPL)", Proc. SPIE 5037, Emerging Lithographic Technologies VII, (16 June 2003); https://doi.org/10.1117/12.484934
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Geometrical optics

Diffraction

Point spread functions

Reticles

Distortion

Projection lithography

Electron beam lithography

RELATED CONTENT

New data postprocessing for e-beam projection lithography
Proceedings of SPIE (August 20 2001)
Comparison Of Autoalign Techniques
Proceedings of SPIE (September 13 1982)
Total performance of Nikon EB stepper R&D tool
Proceedings of SPIE (May 20 2004)
Mix-and-match lithography for half-micrometer technology
Proceedings of SPIE (August 01 1991)

Back to Top