Computer simulation of influence of residual gas on formation of intensive electronic beams in plasma sources of the charged particles

O. N. Petrovich

doi:10.1117/12.498003

1 April 2003 Computer simulation of influence of residual gas on formation of intensive electronic beams in plasma sources of the charged particles

O. N. Petrovich

Author Affiliations +

Proceedings Volume 5025, Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics; (2003) https://doi.org/10.1117/12.498003
Event: Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics, 2001, Moscow, Russian Federation

Abstract

The physics-mathematical model of acceleration gap of intensive electronic beam, whih take into account ionization processes and mobility of emitting surface of plasma was suggested. The developed algorithm of calculation of electron-optical system with the plasma emitter was realized in the programs of numerical simulation of conditions of formation of narrow and tubular electron beams. Numerical simulation has shown, that ionization processes can both positive and negative influences on formation and characteristics of electron beam.

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O. N. Petrovich "Computer simulation of influence of residual gas on formation of intensive electronic beams in plasma sources of the charged particles", Proc. SPIE 5025, Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics, (1 April 2003); https://doi.org/10.1117/12.498003

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