Thermostimulated luminescence and x-ray luminescence of chromium- and titanium-doped leucosapphire single crystals

B. M. Hunda; A. M. Solomon; T. V. Hunda; P. P. Puga; D. I. Bletskan; Y. Y. Bundash

doi:10.1117/12.497158

1 April 2003 Thermostimulated luminescence and x-ray luminescence of chromium- and titanium-doped leucosapphire single crystals

B. M. Hunda, A. M. Solomon, T. V. Hunda, P. P. Puga, D. I. Bletskan, Y. Y. Bundash

Author Affiliations +

Proceedings Volume 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (2003) https://doi.org/10.1117/12.497158
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 2003, 2003, Moscow, Russian Federation

Abstract

Recently a special attention is being paid to the studies of the proper and radiation-induced defects in the α-Al₂O₃ single crystals widely used in optoelectronics, laser technology and dosimetry. This is due to the fact that even in the nominally pure α-Al₂O₃ single crystal the structural defect concentration depends, to a considerable extent, on the initial burden quality, growing method and heat processing conditions. Depending on these factors, a series of crystal properties change essentially, especially the thermostimulated luminescence (TSL) and the X-ray luminescence (XL). The TSL intensity accumulated due to the isodose irradiation may serve the crystal defection criterion. In the present work, the integral TSL and the XL spectra of the nominally pure and doped α-Al₂O₃ single crystals produced by the GOI technique have been studied.

Citation Download Citation

B. M. Hunda, A. M. Solomon, T. V. Hunda, P. P. Puga, D. I. Bletskan, and Y. Y. Bundash "Thermostimulated luminescence and x-ray luminescence of chromium- and titanium-doped leucosapphire single crystals", Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); https://doi.org/10.1117/12.497158

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Crystals

Luminescence

X-rays

Crystallography

Ions

Annealing

Laser applications

Show All Keywords

Keywords/Phrases

Search In:

Publication Years