Effects And Measurement Of Scattering And Absorption Of Thin Films

Jay M. Eastman

doi:10.1117/12.954106

1 March 1974 Effects And Measurement Of Scattering And Absorption Of Thin Films

Jay M. Eastman

Proceedings Volume 0050, Optical Coatings: Applications and Utilization I; (1974) https://doi.org/10.1117/12.954106
Event: Acquisition and Analysis of Pictorial Data, 1974, San Diego, United States

Abstract

The ultimate performance of optical interference filters is often limited by absorption and scattering losses in the coating materials. A basic understanding of these loss mechanisms is necessary to place realistic specifications on a given optical coating. This paper reviews the theories of absorption and scattering as they relate to optical thin films and stresses those aspects most relevant to the optical systems design engineer. Several methods are currently used to measure the absorption and scattering characteristics of substrates and coating materials. These techniques are discussed in sufficient detail to aid in the determination of which method is applicable to a particular problem.

Citation Download Citation

Jay M. Eastman "Effects And Measurement Of Scattering And Absorption Of Thin Films", Proc. SPIE 0050, Optical Coatings: Applications and Utilization I, (1 March 1974); https://doi.org/10.1117/12.954106

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