Diode-laser-based diagnostic for NCl(X)

Steven J. Davis; Phillip A. Mulhall; William J. Kessler; Michael C. Heaven; Gerald C. Manke II

doi:10.1117/12.483500

5 June 2003 Diode laser-based diagnostic for NCl(X)

Steven J. Davis, Phillip A. Mulhall, William J. Kessler, Michael C. Heaven, Gerald C. Manke II

Proceedings Volume 4971, Gas and Chemical Lasers and Intense Beam Applications IV; (2003) https://doi.org/10.1117/12.483500
Event: High-Power Lasers and Applications, 2003, San Jose, CA, United States

Abstract

We present preliminary results of an effort to develop an ultra-sensitive, diode laser-based diagnostic for NCl(X), an important species in the all gas phase iodine laser. This system uses a narrow band, tunable diode laser to probe transitions within the (0,0) band of the NCl(b - X) system near 662 nm. We provide a description of our detection and calibration strategies and present initial calibration results.

Citation Download Citation

Steven J. Davis, Phillip A. Mulhall, William J. Kessler, Michael C. Heaven, and Gerald C. Manke II "Diode laser-based diagnostic for NCl(X)", Proc. SPIE 4971, Gas and Chemical Lasers and Intense Beam Applications IV, (5 June 2003); https://doi.org/10.1117/12.483500

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