Paper
21 February 2003 Picometer-accuracy, laser-metrology gauge for Keck interferometer differential-phase subsystem
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Abstract
Keck Interferometer differential-phase planet-detection system requires a picometer accuracy, large (2 μm to 4 μm) amplitude optical path-length modulator that can operate at fairly high frequencies (250 Hz, 750 Hz, and 1250 Hz, a partial, triangular wave motion). We have developed a gauge which monitors the amplitude of the motion of the path-length modulator and which is capable of reaching a sensitivity of at least 3 pm per sqrt(Hz) within a band width of 1 Hz at 250 Hz, 750 Hz, and 1250 Hz. Two of these gauges are built. The gauges are compared to each other while monitoring a common optical path-length modulator to determine their accuracy. In this paper, the gauge construction details, the results of the gauge accuracy tests as well as the final path-length modulator performance details are presented.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yekta Gursel "Picometer-accuracy, laser-metrology gauge for Keck interferometer differential-phase subsystem", Proc. SPIE 4838, Interferometry for Optical Astronomy II, (21 February 2003); https://doi.org/10.1117/12.459329
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Cited by 6 scholarly publications.
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KEYWORDS
Modulators

Retroreflectors

Mirrors

Collimators

Heterodyning

Laser beam diagnostics

Interferometry

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