Paper
8 November 2002 Local recovery of reflectance and illumination spectra
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Abstract
We present a method for separating a sensor radiance spectrum into a reflectance spectrum and an illumination spectrum. The method is based on the use of subspace models for both reflectance and illumination spectra. The method exploits the fact that reflectance and illumination spectra typically lie in distinct subspaces. The separation algorithm finds the best reflectance and illumination spectra within their respective subspaces. We have applied the algorithm to simulated VNIR radiance spectra using a large database of reflectance and illumination spectra. We have also examined the use of the recovered reflectance spectra for material identification over a database of materials.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kartik Chandra and Glenn Healey "Local recovery of reflectance and illumination spectra", Proc. SPIE 4816, Imaging Spectrometry VIII, (8 November 2002); https://doi.org/10.1117/12.451697
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KEYWORDS
Reflectivity

Databases

Computer simulations

Imaging spectrometry

Sensors

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