Paper
7 November 2002 Nanoscale study of dpolarization phenomena in Pb(Zr0.2Ti0.8)O3 thin films
Thomas Tybell, Patrycja Paruch, Charles H. Ahn, Jean-Marc Triscone
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Abstract
In this paper we discuss how atomic force microscopy can be used to locally study polarization phenomena, elucidating the fundamental properties of ferroelectrics. By combining local probe switching, time dependent electric field microscopy and piezoelectric microscopy, it is possible to address the question of ferroelectricity in ultra thin films. Using these techniques e demonstrate that Pb(Zr0.2Ti0.8)O3 films are ferroelectric down to 40Å. We also discuss the use of the ferroelectric field effect to study switching in thin samples. Furthermore, by examining with a nanometer resolution the writing and reading of ferroelectric regions, the electric field dependence of the domain wall velocity can be quantified, demonstrating that ferroelectric domain wall motion is a creep process in thin films.
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Thomas Tybell, Patrycja Paruch, Charles H. Ahn, and Jean-Marc Triscone "Nanoscale study of dpolarization phenomena in Pb(Zr0.2Ti0.8)O3 thin films", Proc. SPIE 4811, Superconducting and Related Oxides: Physics and Nanoengineering V, (7 November 2002); https://doi.org/10.1117/12.455542
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KEYWORDS
Thin films

Polarization

Ferroelectric materials

Switching

Microscopy

Dielectric polarization

Electrodes

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