Three-dimensional shape measurement system with digital light projector

Jingang Zhong; Jing Zhao

doi:10.1117/12.473564

19 June 2002 Three-dimensional shape measurement system with digital light projector

Jingang Zhong, Jing Zhao

Proceedings Volume 4778, Interferometry XI: Applications; (2002) https://doi.org/10.1117/12.473564
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

A new experiment system of three-dimensional shape measurement is presented. The advantages and the disadvantages are analyzed. In this experiment system, using digital light projector replaces traditional mode of projecting, and electronical grating replaces traditional grating. Obviously, the system has many advantages such as higher precise, easier to realize, etc. But there still are some disadvantages because of the characteristic of the system. We create different direction electronical gratings with different period in the system and use the four-step phase-measuring profilometry to get the phase and height of the detected object. According the experiment result, we analyze the errors introduced by the system. Then decrease such errors as much as possible. From the last result, we can conclude that the system has high practical value.

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Jingang Zhong and Jing Zhao "Three-dimensional shape measurement system with digital light projector", Proc. SPIE 4778, Interferometry XI: Applications, (19 June 2002); https://doi.org/10.1117/12.473564

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KEYWORDS

Digital Light Processing

Charge-coupled devices

Projection systems

Phase shifts

Digital micromirror devices

Modulation

Error analysis

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