High-resolution measurement of the free spectral range of an etalon

P. Douglas Knight; Alvaro Cruz-Cabrera; Brent C. Bergner

doi:10.1117/12.451810

25 October 2002 High-resolution measurement of the free spectral range of an etalon

P. Douglas Knight, Alvaro Cruz-Cabrera, Brent C. Bergner

Proceedings Volume 4772, Electro-Optical System Design, Simulation, Testing, and Training; (2002) https://doi.org/10.1117/12.451810
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

High-resolution measurement of the free spectral range (FSR) for an etalon is becoming more important as greater amounts of information are multiplexed through a single fiber. A method to test the FSR of etalons or etalon based optical components used at telecommunication frequencies is discussed. Slope at a specific point of the etalon response curve is utilized as a means measurement of FSR. The theory that describes how slope, varying as a function of differing etalon signal peaks, can be utilized for the measurement of FSR is developed. This technique has been shown to measure FSR with a resolution of approximately one part in 2000.

Citation Download Citation

P. Douglas Knight, Alvaro Cruz-Cabrera, and Brent C. Bergner "High-resolution measurement of the free spectral range of an etalon", Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); https://doi.org/10.1117/12.451810

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