Review Of Ultraviolet Damage Threshold Measurements At Lawrence Livermore National Laboratory

W.Howard Lowdermilk; David Milam

doi:10.1117/12.942584

15 August 1984 Review Of Ultraviolet Damage Threshold Measurements At Lawrence Livermore National Laboratory

W.Howard Lowdermilk, David Milam

Proceedings Volume 0476, Excimer Lasers: Their Applications & New Frontiers in Lasers; (1984) https://doi.org/10.1117/12.942584
Event: 1984 Technical Symposium East, 1984, Arlington, United States

Abstract

The results of damage threshold measurements made at LLNL using ultraviolet wavelength laser pulses are reviewed. Measurements were made with pulses from a krypton fluoride laser with wavelength of 248 nm and pulse duration of 20 ns and with Nd-glass laser pulses converted to the third harmonic wavelength of 355 nm with duration of 0.6 ns. Measurements are presented for transparent window materials, crystals for harmonic generation, single layer dielectric films of oxide and fluoride materials and multilayer high reflectivity and antireflective coatings.

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W.Howard Lowdermilk and David Milam "Review Of Ultraviolet Damage Threshold Measurements At Lawrence Livermore National Laboratory", Proc. SPIE 0476, Excimer Lasers: Their Applications & New Frontiers in Lasers, (15 August 1984); https://doi.org/10.1117/12.942584

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