Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nm

Christian Goerling; Uwe Leinhos; Klaus R. Mann

doi:10.1117/12.461690

9 April 2002 Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nm

Christian Goerling, Uwe Leinhos, Klaus R. Mann

Author Affiliations +

Proceedings Volume 4679, Laser-Induced Damage in Optical Materials: 2001; (2002) https://doi.org/10.1117/12.461690
Event: Boulder Damage, 2001, Boulder, CO, United States

Abstract

Absorptance losses in MgF₂, CaF₂, and BaF₂ during 193-nm (DUV) and 157-nm (VUV) irradiation were investigated by employing a high-resolution laser calorimetric technique which allows the determination of both single and two-photon absorption coefficients. A strong wavelength dependence of the DUV and VUV absorption characteristics was observed: while effective two-photon absorption takes place at 193 nm, only minor effects were found at 157 nm. Due to the strong nonlinear behaviour the absorptance at 193 nm exceeds that at 157 nm above a critical energy density. A first explanation for this absorption behaviour is given implying the energetic band structure of CaF₂. Furthermore, different single and two-photon absorption coefficients were determined for different CaF₂ samples, indicating a two-photon two-step absorption mechanism. In addition, laser-induced aging was found in MgF₂ at 193 nm, but not at all at 157 nm. The laser-induced fluorescence (LIF) spectra of alkaline- earth fluorides revealed a different emission behaviour for 193-nm and 157-nm excitation. Time-resolved as well as energy dependent measurements of intensities gave evidence for recombination fluorescence arising from self-trapped excitons as well as from specific impurities.

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Christian Goerling, Uwe Leinhos, and Klaus R. Mann "Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nm", Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); https://doi.org/10.1117/12.461690

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