Paper
25 June 2002 Integrating computational models with experimental data in reliability
Michael J. LuValle, Janet L. Mrotek, Leon R. Copeland, Gair D. Brown, Bruce G. LeFevre, Robert Throm
Author Affiliations +
Abstract
In this paper we define what we consider the current defacto paradigm for accelerated testing, discuss what is wrong with it, introduce a more rigorous paradigm, and develop some theory for the new paradigm. Examples used for illustration include modeling degradation of connectors under cyclic stress, modeling degradation of metal films, and a pure Arrhenious thermal model of failure.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael J. LuValle, Janet L. Mrotek, Leon R. Copeland, Gair D. Brown, Bruce G. LeFevre, and Robert Throm "Integrating computational models with experimental data in reliability", Proc. SPIE 4639, Optical Fiber and Fiber Component Mechanical Reliability and Testing II, (25 June 2002); https://doi.org/10.1117/12.481326
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Data modeling

Failure analysis

Statistical modeling

Connectors

Thermal modeling

Reliability

Metals

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