Investigation on internal microstructure damage evolution in Bi-2223/Ag HTS tapes by synchrotron radiation

Xiaofang Hu; Jinglei Yang; Zhenyu Jiang; Xiaoping Wu; Zhendao Wang; Yulian Tian; Wanxia Huang

doi:10.1117/12.468831

29 May 2002 Investigation on internal microstructure damage evolution in Bi-2223/Ag HTS tapes by synchrotron radiation

Xiaofang Hu, Jinglei Yang, Zhenyu Jiang, Xiaoping Wu, Zhendao Wang, Yulian Tian, Wanxia Huang

Proceedings Volume 4537, Third International Conference on Experimental Mechanics; (2002) https://doi.org/10.1117/12.468831
Event: Third International Conference on Experimental Mechanics, 2002, Beijing, China

Abstract

Experiments for damage evolution of internal structure in Bi- 2223/Ag sheathed tape under tensile loading at 77K were done at BSRF. With increasing of load, the start-up and growth of micro cracks in tape were observed. Depending on the experimental results, it showed that: superconducting capability kept on when the material was at linear elasticity, and would lose when the material came into being plastic flow.

Citation Download Citation

Xiaofang Hu, Jinglei Yang, Zhenyu Jiang, Xiaoping Wu, Zhendao Wang, Yulian Tian, and Wanxia Huang "Investigation on internal microstructure damage evolution in Bi-2223/Ag HTS tapes by synchrotron radiation", Proc. SPIE 4537, Third International Conference on Experimental Mechanics, (29 May 2002); https://doi.org/10.1117/12.468831

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