Paper
7 January 2002 Experimental micro-CT system for x-ray NDT
Massimo Rossi, Franco Casali, Matteo Bettuzzi, MariaPia Morigi, Davide Romani, Sergei Vasilievic Golovkin, Vladimir N. Govorun
Author Affiliations +
Abstract
This work describes the setup of an experimental system for microtomography developed in the framework of a collaboration between the Physics Department of the University of Bologna (Italy) and the Geosphaera Research Center of Moscow (Russia). The main goal of this inspection system is to carry out high-resolution analysis in vitro of biomedical samples as well as nondestructive testing (NDT) of industrial components. The detection system consists of a 30x15 mm2 rectangular fiberoptic taper (ratio 2:1) optically coupled to a cooled 12-bit CCD camera (1024x512 pixels). On the entrance window of the taper is deposited a thin layer of Gd2O2S:Tb phosphor which provides the X-light conversion. The image readout is carried out by means of a commercial frame grabber installed on a personal computer and specific software is used for data acquisition and control of the tomographic process. The object under investigation is arranged on a 3-degree micro-positioning system (x-y translation and rotation) and irradiated by an X-ray microfocus beam (up to 200 kVp). The sample can be positioned easily along the source-detector axis in order to obtain a large magnification of details of interest. The X-ray detector has been intensively tested in order to determine its performance in terms of MTF, NPS, and DQE. Moreover, preliminary tests have been carried out on several samples in order to evaluate the performance of the micro-CT system.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Massimo Rossi, Franco Casali, Matteo Bettuzzi, MariaPia Morigi, Davide Romani, Sergei Vasilievic Golovkin, and Vladimir N. Govorun "Experimental micro-CT system for x-ray NDT", Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); https://doi.org/10.1117/12.452862
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Cited by 15 scholarly publications.
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KEYWORDS
X-rays

Modulation transfer functions

Nondestructive evaluation

Sensors

Charge-coupled devices

Inspection

Physics

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