Paper
26 November 2001 Determination of aberrations by processing lenslet array image located on the CCD receiver
Author Affiliations +
Abstract
The quality of large-sized astronomical optics is usually tested by the Hartmann technique. For the accuracy and operational efficiency checking of this techniques different schemes it is necessary to create the mathematical model. In this paper microlens array sensor simulation results and comparison of this scheme with other modifications of this technique is presented. Algorithm, assisting to reach of successes in spots centers determination on the receiver, was created. This algorithm includes iterative the exact search and uses Fourier - image of the aperture of a lens. Research of the Shack-Hartmann testing scheme microlens array based, excluding Hartmann mask application is carried out. Modeling and optimization of the measurement technique is provided, the real requirements to real requirements to elements of the circuit are determined, mathematical apparatus and algorithm of processing of results of the given circuit is developed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nadezhda D. Tolstoba "Determination of aberrations by processing lenslet array image located on the CCD receiver", Proc. SPIE 4473, Signal and Data Processing of Small Targets 2001, (26 November 2001); https://doi.org/10.1117/12.492768
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Charge-coupled devices

Algorithm development

Image processing

Receivers

Mathematical modeling

Data modeling

Imaging arrays

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