Algorithm for surface contouring using two-source phase-stepping digital shearography

Antonio Fernandez; Abundio Davila; Carlos Perez-Lopez; Gabriel Mendiola; Jesus Blanco-Garcia

doi:10.1117/12.437103

14 August 2001 Algorithm for surface contouring using two-source phase-stepping digital shearography

Antonio Fernandez, Abundio Davila, Carlos Perez-Lopez, Gabriel Mendiola, Jesus Blanco-Garcia

Proceedings Volume 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications; (2001) https://doi.org/10.1117/12.437103
Event: IV Iberoamerican Meeting of Optics and the VII Latin American Meeting of Optics, Lasers and Their Applications, 2001, Tandil, Argentina

Abstract

A novel approach to surface contouring using two-source phase-stepping digital shearography is proposed. In this technique, the illumination source is displaced in a prescribed manner to produce a phase difference increment. For a particular experimental arrangement, this phase change is a function of the height coordinates of two sheared points of the object. Therefore, if the height of the sheared point is known, the phase change in each pixel only depends on the height in the same pixel. This requitement is fulfilled by placing a reference plan of suitable dimensions inside the field of view. To measure the shape of a 3D object, first we calculate the phase change using the well- known five-bucket algorithm of phase stepping, and then we use iteration and interpolation routines to find a height value, for which the difference between the phase change calculated by phase stepping and the theoretical value obtained for this height is smaller than a given tolerance. Results obtained with computer-generated shearing speckle interferograms are significantly more accurate than if a linear relationship between phase change and 3D shape is assumed. Finally, we discuss the performance of the suggested approach.

Citation Download Citation

Antonio Fernandez, Abundio Davila, Carlos Perez-Lopez, Gabriel Mendiola, and Jesus Blanco-Garcia "Algorithm for surface contouring using two-source phase-stepping digital shearography", Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); https://doi.org/10.1117/12.437103

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
4 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Shearography

3D metrology

Light sources

Radon

Wavefronts

Algorithms

Laser optics

Show All Keywords

Keywords/Phrases

Search In:

Publication Years