Paper
9 April 2001 Wavemeter with Fizeau interferometer for cw lasers
Emilia A. Alipieva, Elena V. Stoykova, V. Nikolova
Author Affiliations +
Proceedings Volume 4397, 11th International School on Quantum Electronics: Laser Physics and Applications; (2001) https://doi.org/10.1117/12.425118
Event: 11th International School on Quantum Electronics: Laser Physics and Applications, 2000, Varna, Bulgaria
Abstract
In the present work we present a Fizeau wavemeter built on the base of uncoated optical flats for cw lasers. Testing of the wavemeter is made for a 1-mm thick wedge with apex angle of 3 min. The accuracy of the wavemeter is 5 X 10-6. As a second task we study the possibility to use a wedge with reflecting coatings for enhancement of the interference pattern. The main advantage of such a wedge is the substantial rise in the peak intensity of the reflected fringes (two orders of magnitude larger intensity for 50% reflectivity of the coatings compared with the case of uncoated surfaces). The main drawback of using coated surfaces is that they create asymmetric fringes with many subfringes. We show by computer simulation that detection of the interference pattern in the zero-shear plane ensures symmetric fringes and high-accuracy wavelength estimates up to 50% reflectivity of the wedge coatings.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Emilia A. Alipieva, Elena V. Stoykova, and V. Nikolova "Wavemeter with Fizeau interferometer for cw lasers", Proc. SPIE 4397, 11th International School on Quantum Electronics: Laser Physics and Applications, (9 April 2001); https://doi.org/10.1117/12.425118
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Cited by 5 scholarly publications.
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KEYWORDS
Reflectivity

Calibration

Continuous wave operation

Photodiodes

Optical filters

Phase measurement

Reflection

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