Assessment of 3D noise methodology for thermal sensor simulation

Eddie L. Jacobs; Jae Cha; Keith A. Krapels; Van A. Hodgkin

doi:10.1117/12.439150

10 September 2001 Assessment of 3D noise methodology for thermal sensor simulation

Eddie L. Jacobs, Jae Cha, Keith A. Krapels, Van A. Hodgkin

Proceedings Volume 4372, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII; (2001) https://doi.org/10.1117/12.439150
Event: Aerospace/Defense Sensing, Simulation, and Controls, 2001, Orlando, FL, United States

Abstract

An approach to determining the fidelity of synthetic noise based on the NVESD 3-D noise methodology is introduced. After reviewing the theory of 3-D noise analysis, three methods for the generation of synthetic noise are outlined: power spectrum matching, physical noise modeling, and 3-D noise parameter inversion. Real and synthetic noise samples from a staring thermal sensor were analyzed using a 3-D noise analysis. A series of simulated minimum resolvable temperature difference (MRTD) experiments using real and synthetic noise were also conducted. Results from the analysis and the MRTD indicate that modifications to the 3-D noise parameter inversion method could provide a more accurate match to real MRTDs. In addition, the MRTD method used in this research could be used to quantify the relative impact of each component of the 3-D noise model.

Citation Download Citation

Eddie L. Jacobs, Jae Cha, Keith A. Krapels, and Van A. Hodgkin "Assessment of 3D noise methodology for thermal sensor simulation", Proc. SPIE 4372, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XII, (10 September 2001); https://doi.org/10.1117/12.439150

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