Quantitative study of laser damage probabilities in silica and calibrated liquids: comparison with theoretical prediction

Jean-Yves Natoli; Laurent Gallais; Hassan Akhouayri; Claude Amra

doi:10.1117/12.425018

12 April 2001 Quantitative study of laser damage probabilities in silica and calibrated liquids: comparison with theoretical prediction

Jean-Yves Natoli, Laurent Gallais, Hassan Akhouayri, Claude Amra

Author Affiliations +

Proceedings Volume 4347, Laser-Induced Damage in Optical Materials: 2000; (2001) https://doi.org/10.1117/12.425018
Event: Laser-Induced Damage in Optical Materials: 2000, 2000, Boulder, CO, United States

Abstract

The experimental setup developed in Marseille for the laser damage testing allows a localized study. Indeed the use of a 25 micrometers for the waist of the focused beam, permits to de-correlate the extrinsic damage due to the micronic defects (visible under microscope) for the intrinsic ones (non-detectable before damage with conventional imaging systems). The probability of damage versus incident fluence is an S curve given in the range of two thresholds, S_L and S_H, the low and high damage thresholds. Most often the shape of probability damage curves are different between the intrinsic and the extrinsic cases. In our arrangement the beam size and the extrinsic defect size are in the same range, so by pointing at these visible defects it is possible to determine their specific threshold, and the density of defect is directly obtained from the optical image. Therefore a specific study of the intrinsic zones by pointing the beam at a zone free of extrinsic point, allows us to focus our attention only on these invisible defects. These particles are supposed to be nano-sized. The highlight and the identification of these nono-precursors is the aim of this paper.

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Jean-Yves Natoli, Laurent Gallais, Hassan Akhouayri, and Claude Amra "Quantitative study of laser damage probabilities in silica and calibrated liquids: comparison with theoretical prediction", Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); https://doi.org/10.1117/12.425018

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