Paper
8 March 2001 Single-shot frequency tracer for ultrashort-pulse characterization
Vidas Kabelka, A. V. Masalov
Author Affiliations +
Proceedings Volume 4318, Smart Optical Inorganic Structures and Devices; (2001) https://doi.org/10.1117/12.417583
Event: Advanced Optical Materials and Devices, 2000, Vilnius, United States
Abstract
We have designed and manufactured a simple device, named frequency tracer, (FT) for fs pulse temporal phase measurements. FT is able to present a determination of the instantaneous frequency dependence on time fs pulse together with an accurate data sufficient for a complete characterization of light field. The main feature of our designed FT device is the simplicity: no spectral apparatus is needed and fs pulse phase distortion determination does not require complicated iterative mathematical algorithms. Using a single-shot real-time implementation of this technique the multi-pass amplifier (MPA) compressor of fs Ti:sapphire laser system was adjusted.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vidas Kabelka and A. V. Masalov "Single-shot frequency tracer for ultrashort-pulse characterization", Proc. SPIE 4318, Smart Optical Inorganic Structures and Devices, (8 March 2001); https://doi.org/10.1117/12.417583
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KEYWORDS
Mercury

Iodine

Vacuum ultraviolet

Ultraviolet radiation

Quartz

Magnesium fluoride

Lamps

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